IJCRRI Journ Cur Res ReInternational Journal of Current Research and ReviewI Journ Cur Res Re2231-21960975-5241Radiance Research Academy2144General SciencesEFFECT OF THICKNESS AND ANNEALING TEMPERATURES ON STRUCTURAL AND MORPHOLOGICAL PROPERTIES OF (SB2S3)1-X (BI2S3)X THIN FILMS N.Jessy MathewOommenRachelPUsha Rajalakshmi2436This article is copyright of Popeye Publishing, 20092009This is an open-access article distributed under the terms of the Creative Commons Attribution (CC BY 4.0) Licence. You may share and adapt the material, but must give appropriate credit to the source, provide a link to the licence, and indicate if changes were made.

(Sb2S3)1-x (Bi2S3)x (with x= 0.03, 0.05, 0.1) thin films were prepared on chemically well cleaned glass substrates by thermal evaporation technique for two thickness. The orthorhombic crystal structure of the (Sb2S3)1-x (Bi2S3)x powder samples and thin films have been found out from XRD powder data and confirms the transition of films from amorphous to polycrystalline with thermal treatment at 523K. Also lattice parameters, crystallite sizes and interplanar spacings for the newly prepared ternary compounds (Sb-Bi-S) have been calculated. The XPS spectra were carried out to identify the surface compositions. The elemental percentage in each compound was verified by EDAX. Increase of crystallite size with thickness and temperature was proved by XRD and the influences of thickness and annealing temperature on roughness and grain size was observed from AFM measurements.

Thermal evaporation technique Ternary compounds Amorphous Polycrystalline Orthorhombic crystal structure